Contents of the ISPFMT.DOC file
THIS PROGRAM CAN DESTROY CUSTOMER DATA. BE SURE TO HAVE ALL
VALUABLE DATA BACKED UP AND VERIFIED BEFORE CONTINUING!
This is a Low-Level format utility designed to help you
maintain GROWN DEFECTS on your WESTERN DIGITAL Intelligent
The user must select drive 0 or 1 and the model type.
Performs a LOW-LEVEL FORMAT, pre-existing defects are
mapped out. ESC will abort back to the main menu. If
aborted the user will be warned that previous defects will
not be updated.
First LOW-LEVEL format is performed then a short SURFACE
analysis writes and read_verifies the entire surface of
the disk with two critical patterns. This function can be
useful in a production environment. All pre-existing and
surface analysis defects will be automatically mapped out.
ESC will abort back to the main menu. If FORMAT is aborted
the user will be warned that previous defects will not be
Ten critical patterns are used to write and read-verify the
entire surface of the disk. This function is an in-depth
check for GROWN defects. All pre_existing and surface
analysis defects will be automatically mapped out. ESC
will cause an abort back to the main menu, defects are not
updated. IF a previous VERIFY updated the grown map,
SURFACE updates to the map will not occur. FORMAT or
UPDATE DEFECTS will clear this condition and allow updates
This function performs a read-verify of the entire disk.
Any new defects are presented to the user. Upon exit of
the defects display the user is asked if the newly found
defects should be added to the defect list. Yes will
append these defects to the GROWN defects map on the drive.
A subsequent VERIFY will not allow more defects to be marked
until FORMAT is run. A subsequent FORMAT or UPDATE DEFECTS
will then map out these defects along with any previous
defects. No will exit without updating the defect list.
ESC will cause an abort back to the main menu.
This function will update all defects on the drive selected.
The factory and grown defect lists will be used to update
defects on the drive. This will clear a previous VERIFY
update to the grown defect map and allow SURFACE ANALYSIS
and VERIFY to update the maps.
Any drive in CMOS mother-board setup will be re-established.
If drive 0 or drive 1 is attached and powered up it will be
PARKED. Some systems and drives will not respond after
this operation. The user is cautioned to WARM or COLD boot
the system to GUARANTEE proper operation.
ERROR LOG DESCRIPTION:
Drive, Model number and the Function that was executed is
shown. Each physical location of a GROWN defect is shown
once with cylinder, head, sector, status, error, and
pattern/window information. The status and error display
information is from the first error occurance. The pattern
and window information are shown from left to right in order
of occurance. Each pattern has a letter designation:
a d6b5ad6b5a ----------------- Isolated ones WD
b c6319c6319 Isolated ones IBM
c cf3cf3cf3cf3 --------------- Isolated ones WD & IBM
d 492492492492 HI frequency IBM all ones
e 0101010101 ----------------- Isolated zero's WD
f 136b31136bb3 Mixed all frequency WD
g c086043021800c086043021800 WD worst case pattern
h 5ab6b5ab6b Max jitter
i 3333333333 ----------------- Low frequency
j 0000000000 Hi frequency
The window information has a letter designation:
E Early read
L Late read
N Normal read
W WRITE only
Four pattern/window entries for a designated sector would
Patterns a and c failed during read-verify with both EARLY
and LATE window.
model 93042A/95042A (20 meg)
(782 cyl, 2 heads, 27 sec PHYSICAL)
(615 cyl, 4 heads, 17 sec TRANSLATION type 2)
model 93044A/95044A (40 meg)
(782 cyl, 4 heads, 27 sec PHYSICAL)
(977 cyl, 5 heads, 17 sec TRANSLATION type 17)
SINGLE DRIVE J8 no jumpers
MASTER J8 5-6 jumper.
SLAVE J8 3-4 jumper.
J8 1-2 for slave to original CONNER CP342, CP3022.
----------------------------END ISPFMT HELP--------------------------